Particle measurement technology plays a vital role in various industries, including pharmaceuticals, environmental monitoring, and manufacturing, where it is essential for ensuring product quality and safety, as well as monitoring and controlling pollution levels. This technology involves the analysis and measurement of particles in different environments, such as air, water, or solid materials, to determine […]
Semiconductor materials are a crucial component in the field of electronics and technology. These materials have unique properties that make them ideal for use in a wide range of applications, from computer chips to solar cells. A semiconductor is a material that has electrical conductivity between that of a conductor and an insulator. This means […]
Semiconductor wafer standards are crucial in the electronics industry as they define the specifications and parameters for the production of semiconductor wafers. These standards ensure that the wafers meet the required quality and performance levels, which are essential for the manufacturing of electronic devices. Semiconductor wafer standards cover a wide range of parameters, including size, […]
What is the best method to store Calibration Wafer Standards produced with particle sizes of less than 100 nm? Cleanrooms normally operate at 70F, about 21C, and typically around 40% humidity. When using a Calibration Wafer Standard to calibrate your Wafer Inspections Systems in the lab, the particle sizes deposited on the wafer standard under […]
Silica Particle Size Standards In today’s semiconductor metrology labs, the wafer inspection tools, use high powered lasers to scan 200 mm and 300 mm silicon wafers to detect surface particles down to < 30 nanometers. When calibrating high laser power scanning systems, the size calibration is extremely important, in order to detect at 30 nm; […]
What is the best method to store Calibration Wafer Standards produced with particle sizes of less than 100 nm? Cleanrooms normally operate at 70F, about 21C, and typically around 40% humidity. When using a Calibration Wafer Standard to calibrate your Wafer Inspections Systems in the lab, the particle sizes deposited on the wafer standard under […]
[et_pb_section fb_built=”1″ admin_label=”section” _builder_version=”4.16″ global_colors_info=”{}”][et_pb_row admin_label=”row” _builder_version=”4.16″ background_size=”initial” background_position=”top_left” background_repeat=”repeat” global_colors_info=”{}”][et_pb_column type=”4_4″ _builder_version=”4.16″ custom_padding=”|||” global_colors_info=”{}” custom_padding__hover=”|||”][et_pb_text admin_label=”Text” _builder_version=”4.16″ background_size=”initial” background_position=”top_left” background_repeat=”repeat” global_colors_info=”{}”] Silica Particle Size Standards In today’s semiconductor metrology labs, the wafer inspection tools, use high powered lasers to scan 200 mm and 300 mm silicon wafers to detect surface particles down to < […]
