Introduction In the high-precision world of semiconductor manufacturing, accuracy and consistency in particle detection and measurement are paramount. Applied Physics Corporation’s SURF-CAL™ Particle Size Standards represent the gold standard in calibration tools for Scanning Surface Inspection Systems (SSIS). These precision-engineered standards enable semiconductor manufacturers to maintain consistent quality control across multiple inspection tools and facilities, […]
Introduction Particle size is a fundamental characteristic that plays a crucial role in various manufacturing processes across multiple industries, including pharmaceuticals, food production, cosmetics, and materials engineering. The size of particles can significantly influence the behavior of materials during processing and their performance in end-use applications. In essence, particle size refers to the dimensions of […]
Introduction Particle size refers to the dimensions of individual particles within a material, which can range from nanometers to millimeters. In various industries, including pharmaceuticals, food production, and materials science, particle size plays a crucial role in determining the overall quality of a product. The size of particles can influence not only the physical properties […]
